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SN74BCT8374ANTG4
IC SCAN TEST DEVICE 8BIT 24-PDIP
Model:
SN74BCT8374ANTG4
Manufacturer:
Texas Instruments
Category:
Integrated Circuits (ICs)
> Logic
> Specialty Logic
Description:
IC SCAN TEST DEVICE 8BIT 24-PDIP
RoHS:
YES
：
SN74BCT8374ANTG4Specifications
Part Status
:
Obsolete
Mounting Type
:
Through Hole
Operating Temperature
:
0°C ~ 70°C
Package / Case
:
24-DIP (0.300", 7.62mm)
Supplier Device Package
:
24-PDIP
Number of Bits
:
8
Supply Voltage
:
4.5V ~ 5.5V
Logic Type
:
Scan Test Device with D-Type Edge-Triggered Flip-Flops
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